Dispersion measurements with white-light interferometry

نویسندگان

  • J.-C. Diels
  • Scott Diddams
  • Jean-Claude Diels
چکیده

White-light interferograms provide a simple, accurate, and physically intuitive picture of what happens to broadband optical pulses on transmission through, or reflection from, common optical materials. Quantitative measurement of group delay are made with an accuracy of 60.1 fs and with high spectral resolution. This measurement accuracy is applied to the determination of d2nydl2 and d3nydl3 of fused silica with an accuracy of 65 3 1025 mm22 and 61 3 1023 mm23, respectively. Further applications are found in the measurement of the dispersion of broadband mirrors and a multiple-quantum-well structure.  1996 Optical Society of America

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تاریخ انتشار 1996